Estoy tratando de averiguar si el disco duro de mi Mac podría estar fallando, o que podría ser algún otro componente o el cable HD.
Después de transportar mi Mac hace una semana, empezó a hacer "beachball" (bola de playa) con frecuencia. Quiero decir MUCHO, como cada vez que intento cambiar la ventana o hacer cualquier cosa, se queda en la playa entre 10 segundos y algunos minutos. Antes usaba Caffeine para evitar que el portátil se durmiera y me temo que tal vez dejé Caffeine activado durante el transporte, lo que podría haber dañado el disco, pero no estoy seguro.
Lo más notable es que cualquier operación que involucre al propio disco parece ser muy muy lenta.
Probé con DiskWarrior, por ejemplo, y tardó un día y medio en reconstruir mis directorios del estado 8 al estado 10, lo que no ayudó al rendimiento del ordenador.
También probé DriveGenius para buscar errores físicos. Tardó unas 12 horas en llegar al 26% (y esto no era la "prueba ampliada") y encontró dos "áreas dudosas", tras lo cual lo cancelé porque probablemente tardaría otros dos días en terminar.
EtreCheck indicó algunos errores de EH en su SmartREPORT.
Las descargas y las operaciones de copia (como las copias de seguridad que hice) a veces son rápidas y luego se vuelven muy lentas y/o se congelan durante un par de minutos. A veces continúan, a veces no.
El arranque no da problemas aunque es un poco lento, excepto en modo seguro que lo dejé durante 45 minutos y la barra de porcentaje llegó hasta el final pero no llegó a arrancar.
El HD no hace ningún ruido raro. No he recibido ningún mensaje sobre posibles datos corruptos.
Básicamente estoy tratando de averiguar si debo pasar por la molestia de comprar un nuevo cable de HD, o si simplemente debo reemplazar el HD inmediatamente, o tal vez tratar de formatear a bajo nivel el disco y reinstalar todo para ver si eso podría deshacerse de los posibles bloques malos.
Especificaciones: Macbook Pro Mid 2012 con El Capitan Unidad Apple Toshiba de 500GB con 45GB de espacio libre en disco Memoria RAM de 8 GB recientemente actualizada que no es de Apple
ps sí actualicé mis archivos importantes - sin embargo no tengo un HD en el momento lo suficientemente grande como para clonar mi disco entero.
Smartctl -a disco0: Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
`
=== START OF INFORMATION SECTION === Device Model: APPLE HDD TOSHIBA MK5065GSXF Serial Number: X2NZCESBT LU WWN Device Id: 5 000039 45440633e Firmware Version: GV201B User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Nov 6 11:42:10 2016 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled
=== START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED
General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 167) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 2075 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 11031 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 082 082 000 Old_age Always - 7379 10 Spin_Retry_Count 0x0033 253 100 030 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 8880 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 16387 192 Power-Off_Retract_Count 0x0032 097 097 000 Old_age Always - 1984 193 Load_Cycle_Count 0x0032 071 071 000 Old_age Always - 297692 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 34 (Min/Max 12/46) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 13 220 Disk_Shift 0x0002 100 100 000 Old_age Always - 108 222 Loaded_Hours 0x0032 085 085 000 Old_age Always - 6352 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 226 Load-in_Time 0x0026 100 100 000 Old_age Always - 303 240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0 254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 1100
SMART Error Log Version: 1 ATA Error Count: 5 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5 occurred at disk power-on lifetime: 7377 hours (307 days + 9 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 01 c7 da f1 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00f1dac7 = 15850183
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 00 c8 d9 f1 40 00 00:13:08.384 WRITE DMA EXT 35 00 00 c8 d8 f1 40 00 00:13:08.382 WRITE DMA EXT 35 00 00 c8 d7 f1 40 00 00:13:08.378 WRITE DMA EXT 35 00 00 c8 d6 f1 40 00 00:13:08.376 WRITE DMA EXT 35 00 00 c8 d5 f1 40 00 00:13:08.374 WRITE DMA EXT
Error 4 occurred at disk power-on lifetime: 7370 hours (307 days + 2 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 01 c7 1e f1 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00f11ec7 = 15802055
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 00 c8 1d f1 40 00 03:52:49.218 WRITE DMA EXT 35 00 00 c8 1c f1 40 00 03:52:49.216 WRITE DMA EXT 35 00 00 c8 1b f1 40 00 03:52:49.214 WRITE DMA EXT 35 00 00 c8 1a f1 40 00 03:52:49.212 WRITE DMA EXT 35 00 00 c8 19 f1 40 00 03:52:49.208 WRITE DMA EXT
Error 3 occurred at disk power-on lifetime: 7362 hours (306 days + 18 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 01 0f ee e3 40 Error: ICRC, ABRT 1 sectors at LBA = 0x00e3ee0f = 14937615
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 00 10 ed e3 40 00 01:37:09.282 WRITE DMA EXT 35 00 00 10 ec e3 40 00 01:37:08.756 WRITE DMA EXT 35 00 00 10 eb e3 40 00 01:37:08.232 WRITE DMA EXT 35 00 00 10 ea e3 40 00 01:37:07.708 WRITE DMA EXT 35 00 00 10 e9 e3 40 00 01:37:07.184 WRITE DMA EXT
Error 2 occurred at disk power-on lifetime: 7268 hours (302 days + 20 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 01 af a8 74 40 Error: ICRC, ABRT 1 sectors at LBA = 0x0074a8af = 7645359
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 00 b0 a7 74 40 00 03:45:55.590 WRITE DMA EXT 35 00 00 b0 a6 74 40 00 03:45:55.590 WRITE DMA EXT 35 00 00 b0 a5 74 40 00 03:45:55.589 WRITE DMA EXT aa aa aa aa aa aa aa ff 03:45:55.582 [RESERVED] 35 00 00 b0 a4 74 40 00 03:45:45.580 WRITE DMA EXT
Error 1 occurred at disk power-on lifetime: 7259 hours (302 days + 11 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH
84 51 01 6f 14 54 40 Error: ICRC, ABRT 1 sectors at LBA = 0x0054146f = 5510255
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
35 00 00 70 13 54 40 00 01:28:44.723 WRITE DMA EXT 35 00 00 70 12 54 40 00 01:28:44.721 WRITE DMA EXT 35 00 00 70 11 54 40 00 01:28:44.719 WRITE DMA EXT 35 00 00 70 10 54 40 00 01:28:44.717 WRITE DMA EXT 35 00 00 70 0f 54 40 00 01:28:44.713 WRITE DMA EXT
SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]
`
SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
